Advanced materials analysis and characterization techniques

Short description

CEA (a French governmental organization) is involved in ageing and characterization of CSP components since many years. 

Methods for evaluation of material properties: Micro hardness analysis of specimens, Microscopically analysis. Sample preparation: metallographic specimens. (e.g. by cutting, hot mounting, impregnation and cold mounting of porous specimens, polishing, chemical or electrochemical analysis of specimens), SEM EDS, FTIR

Main technical features

Based on FTIR-ATR spectroscopy, the study is dedicated firstly to the mechanisms of paints degradation according to the constraints like temperature, UV, humidity and liquid water.

Innovative aspects

Results obtained by FTIRATR show that temperature does not affect the paint structure even after 5700h at 100°C .The whole degradation of the silver layer by pitting is not necessary associated to high paint degradation according to FTIR measurement even if some minor degradation was observed by colorimetric measurement. Infrared measurement by FTIR ATR method is a good tool to characterize the degradation of the protective paint coats. A SEM observation of surface confirms the hypothesis of a morphological modification of the materials, a SEM picture of surface sample ageing at 400°C, shows a beginning in degradation after 3400h but without optical performances degradation.

Applications

FTIR-ATR analyses permit to define the type of the binder and the main pigments

Type of partner sought

N/C

Tasks to be performed by the partner you are looking for.

MASCIR (Moroccan foundation for advanced Science, Innovation and Research-Morocco) and CEA (French Alternative Energies and Atomic Energy Commission) collaborate in a study with the main objective to understand the mechanisms of degradation occurring at each kind of mirror tested.

Contact person details
Details
Showcase ID
JP.EERA.236:Advanced materials analysis and characterization techniques
Joint Programme / IRP / ECRIA
IRP STAGE-STE
Development stage
N/A
IPR / IPR Status
Trade secret (not applicable)
Exploitation status
N/C
Technology keyword(s)
Optical characterization of STE materials